发明名称 METHOD FOR FABRICATING GALLIUM NITRIDE SUBSTRATE
摘要 PURPOSE: A method for manufacturing a gallium nitride substrate is provided to reduce the generation of crack by depositing a material having a large lattice parameter on a gallium nitride layer. CONSTITUTION: A gallium nitride layer (200) is grown on a base substrate (100). A compressive stress applying layer (300) is deposited in the Ga plane of the gallium nitride layer. The base substrate is separated from the gallium nitride layer. The compressive stress applying layer is removed from the Ga plane to form a free-standing GaN wafer.
申请公布号 KR20130075921(A) 申请公布日期 2013.07.08
申请号 KR20110144242 申请日期 2011.12.28
申请人 SAMSUNG CORNING PRECISION MATERIALS CO., LTD. 发明人 BAE, JUN YOUNG;PARK, HYUN JONG;LEE, WON JO;LEE, SUNG KEUN;CHUNG, BYUNG KYU;CHOI, JUN SUNG;KIM, JOON HOI;PARK, BO IK;PARK, CHEOL MIN;SHIN, SEONG HWAN
分类号 H01L21/20 主分类号 H01L21/20
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