发明名称 NONVOLATILE SEMICONDUCTOR MEMORY DEVICE
摘要 PROBLEM TO BE SOLVED: To prevent erroneous erasure in a non-selection block and reduce degradation of a tunnel insulation film at the erasure of a selection block.SOLUTION: A preliminary erasure controller 13A applies a constant erasure voltage VE to a well side of a memory cell, to erase the memory cell in units of blocks B1-Bn, and an erasure controller 13B applies the voltage higher than that at the erasure time to a control gate electrode of the memory cell while applying a preliminary erasure voltage VPE to the well side of the memory cell before the erasure, to preliminarily erase the memory cell.
申请公布号 JP2013134800(A) 申请公布日期 2013.07.08
申请号 JP20110285669 申请日期 2011.12.27
申请人 TOSHIBA CORP 发明人 KATO KOJI
分类号 G11C16/02;G11C16/04 主分类号 G11C16/02
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