| 摘要 |
PURPOSE: A test device of a chip type super capacitor is provided to easily confirm charging and discharging states of the super capacitor. CONSTITUTION: A probe board (60) forms a probe pin touching an external connection pad of a chip type super capacitor included in a tray. A charging light emitting diode (73) displays a charging state of power supplied between a power supply unit and the super capacitor. A discharging light emitting diode (75) receives power from the super capacitor through the probe board with a probe pin touching the super capacitor. A control unit (79) connects the probe board with the power supply unit when power is charged to the super capacitor while the probe pin is touching the super capacitor displaying a discharging state. The control unit connects the probe board with the discharging light emitting diode during the discharge of the super capacitor. [Reference numerals] (72) Relay; (74) Controller; (76) Timer; (79) Control unit
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