发明名称 RADIATION INTENSITY MEASURING METHOD FOR RADIATION INTENSITY MEASURING APPARATUS
摘要 PROBLEM TO BE SOLVED: To provide a radiation intensity measuring apparatus capable of monitoring intensity changes of light made incident on a light receiving part and capable of feeding back correction matched with changes of light intensity of measurement results.SOLUTION: The radiation intensity measuring apparatus includes a measurement device for measuring a component not caused by excitation of a photostimulable crystal of light measured by the light receiving part, analyzes influences of optical fiber deterioration and light bending loss, and uses the analyzed results as correction data. Further, time distributions of light intensities of both of light not caused by the excitation of the photostimulable crystal and light caused by the excitation of the photostimulable crystal are measured, and a change in the crystal structure of the photostimulable crystal is monitored from a change of the time distribution of the light caused by the excitation of the photostimulable crystal with respect to the time distribution of the light not caused by the excitation of the photostimulable crystal.
申请公布号 JP2013134158(A) 申请公布日期 2013.07.08
申请号 JP20110284700 申请日期 2011.12.27
申请人 HITACHI LTD 发明人 OKADA KOICHI;TADOKORO TAKAHIRO;KITAGUCHI HIROSHI;UENO KATSUNOBU;KAIHARA AKIHISA;KUWABARA HITOSHI;SAKAKIBARA YOSHINOBU;INAMURA YUTA
分类号 G01M11/00;G21K4/00 主分类号 G01M11/00
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