发明名称 CONTACT PROBE AND SOCKET FOR ELECTRIC COMPONENT
摘要 PROBLEM TO BE SOLVED: To securely short-circuit a plunger and a barrel internally in a contact probe.SOLUTION: A plunger 22 includes: a first contact end part 22a provided to a one-end part coming into contact with a wiring board 12; a spring receiving part 22b positioned on a barrel-23 side of the first contact end part 22a; and an other-end part 22c extending further to a barrel-23 side of the spring receiving part 22b. The barrel 23 includes: a second contact end part 23a coming into contact with an IC package 13; a cylinder part 23b in which a coil spring 24 is housed; a guide hole 23c which has a smaller inner diameter than the cylinder part 23b and is formed more on the side of the second contact end part 23a than the cylinder part 23 and into which the other-end part 22c of the plunger 22 is inserted; and a step part 23d formed between the cylinder part 23b and guide hole 23c. When the plunger 22 is pressed in the barrel 23 and the other-end part 22c of the plunger 22 is inserted into the guide hole 23c, the other-end part 22c comes into contact with the barrel 23 to short-circuit internally.
申请公布号 JP2013134192(A) 申请公布日期 2013.07.08
申请号 JP20110285795 申请日期 2011.12.27
申请人 ENPLAS CORP 发明人 KANESASHI HOKUTO
分类号 G01R1/067;G01R1/073;G01R31/26 主分类号 G01R1/067
代理机构 代理人
主权项
地址