发明名称 METHOD FOR DETERMINING THREE-DIMENSIONAL DISTRIBUTION OF INFRARED ABSORPTION SPECTRUM OF SILICA GLASS CRUCIBLE, AND METHOD FOR MANUFACTURING SILICON MONOCRYSTAL
摘要 PROBLEM TO BE SOLVED: To provide a method for determining a three-dimensional distribution of an infrared absorption spectrum of a silica glass crucible with high precision.SOLUTION: According to the present invention, there is provided a method for determining a three-dimensional distribution of an infrared absorption spectrum of a silica glass crucible including the steps of: moving an inner distance-measuring part along an inner surface of the silica glass crucible in a noncontact manner; at a plurality of measuring points in a moving path, irradiating the inner surface of the silica glass crucible with laser light obliquely thereto from the inner distance-measuring part and detecting inner surface reflected light from the inner surface to measure an inner surface distance between the inner distance-measuring part and the inner surface; calculating a three-dimensional shape of an inner surface of the silica glass crucible by associating a three-dimensional coordinate of each measuring point with the inner surface distance; and determining a three-dimensional distribution of an infrared absorption spectrum of the inner surface by measuring an infrared absorption spectrum of the inner surface at a plurality of measuring points on the three-dimensional shape.
申请公布号 JP2013134056(A) 申请公布日期 2013.07.08
申请号 JP20110282406 申请日期 2011.12.22
申请人 JAPAN SIPER QUARTS CORP 发明人 SUDO TOSHIAKI;SATO TADAHIRO;KITAHARA MASARU;KODAMA MAKIKO
分类号 G01B11/24;C03B20/00;C30B15/10;C30B29/06;G01C3/06 主分类号 G01B11/24
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