发明名称 APPARATUS AND METHOD FOR MEASURING LEAD CO-PLANARITY OF LEAD-TYPE COMPONENT
摘要 PURPOSE: A device and a method for measuring the co-planarity of leads of a lead-type structure are provided to measure the co-planarity of leads simultaneously. CONSTITUTION: A device for measuring the co-planarity of leads of a lead-type structure includes a flat plate (10), a lighting element (20), an image sensor (30), and a measurement module (40). The flat plate is made of a light transmitting material and formed into a grid form. The lighting member irradiates lights on a flat plate in which one or more leads adheres on a surface and irradiates lights from the other surface of the flat plate. The image sensor senses images of the leads in the other surface of the flat plate when the lighting member irradiates the lights. The measurement module measures the co-planarity of the leads based on the sensed images. [Reference numerals] (40) Measurement module
申请公布号 KR20130075556(A) 申请公布日期 2013.07.05
申请号 KR20110143955 申请日期 2011.12.27
申请人 KOREA ELECTRONICS TECHNOLOGY INSTITUTE 发明人 HAN, CHANG WOON
分类号 G01B11/25;G01N21/956 主分类号 G01B11/25
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