发明名称 SAMPLE ANALYSIS APPARATUS
摘要 PURPOSE: An apparatus for sample analysis is provided to stop a disc in a correct position only with a protrusion formed on a lower surface of the disc and a stopper formed on a slider. CONSTITUTION: An apparatus for sample analysis (1) comprises: a disc (10) including at least one detection area and rotatably arranged with a rotary shaft as a center; an optical sensor configured to sense a reaction result appeared in at least one detection area; at least one position determination protrusions (131-133) which is formed to protrude in one side of the disc; a slider (30) which is movably arranged to at least one direction among the outer side and the inner side of a radius direction of the disc; a stopper (320) which is mounted on a slider, configured to stop a rotation of the disc by blocking at least one position determination protrusions.
申请公布号 KR20130075119(A) 申请公布日期 2013.07.05
申请号 KR20110143340 申请日期 2011.12.27
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 KIM, HONG GEUN;KIM, DONG YOUNG;KIM, CHUNG UNG
分类号 G01N35/00;G01N21/75;G01N33/483 主分类号 G01N35/00
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