发明名称 QUANTATIVE ANALYSYS METHOD FOR DIELECTRIC SUBSTANCE OF MULTI-LAYER CERAMIC CAPACITOR
摘要 PURPOSE: A method for quantitatively analyzing a multi-layer ceramic capacitor dielectric material is provided to improve the homogeneity of a glass bead and to reduce analysis errors. CONSTITUTION: A method for quantitatively analyzing a multi-layer ceramic capacitor dielectric material is as follows. A mixture in which a sample including additives of a dielectric substance and a fusing agent are mixed is heated. A glass bead is formed by cooling the mixture after the mixture is molten. The glass bead is analyzed by an X-ray fluorescent laser so that the amount of the additives is obtained. [Reference numerals] (AA) X-ray intensity (kcps)
申请公布号 KR20130075488(A) 申请公布日期 2013.07.05
申请号 KR20110143873 申请日期 2011.12.27
申请人 SAMSUNG ELECTRO-MECHANICS CO., LTD. 发明人 KIM, EUN HYUK;LEE, CHANG JOO
分类号 G01N23/223;H01G4/12;H01G4/30 主分类号 G01N23/223
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