发明名称 |
QUANTATIVE ANALYSYS METHOD FOR DIELECTRIC SUBSTANCE OF MULTI-LAYER CERAMIC CAPACITOR |
摘要 |
PURPOSE: A method for quantitatively analyzing a multi-layer ceramic capacitor dielectric material is provided to improve the homogeneity of a glass bead and to reduce analysis errors. CONSTITUTION: A method for quantitatively analyzing a multi-layer ceramic capacitor dielectric material is as follows. A mixture in which a sample including additives of a dielectric substance and a fusing agent are mixed is heated. A glass bead is formed by cooling the mixture after the mixture is molten. The glass bead is analyzed by an X-ray fluorescent laser so that the amount of the additives is obtained. [Reference numerals] (AA) X-ray intensity (kcps)
|
申请公布号 |
KR20130075488(A) |
申请公布日期 |
2013.07.05 |
申请号 |
KR20110143873 |
申请日期 |
2011.12.27 |
申请人 |
SAMSUNG ELECTRO-MECHANICS CO., LTD. |
发明人 |
KIM, EUN HYUK;LEE, CHANG JOO |
分类号 |
G01N23/223;H01G4/12;H01G4/30 |
主分类号 |
G01N23/223 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|