发明名称 SYSTEME A ETALONNAGE COMMUN ET PROCEDE CORRESPONDANT
摘要 The invention relates to a system (1) comprising a deformable surface (2) and a first and a second sensor (C1, C2) designed to provide a first and a second measurement signal (S1, S2) intended to be collected by a processing circuit (12), said system (1) comprising first and second measurement paths (V1, V2) for collecting the first and second measurement signals (S1, S2), said system (1) being characterised in that it comprises a common calibration member (20) for simultaneously injecting into the first and second measurement paths (VI, V2) a calibration signal (SE), said common calibration member (20) being designed so that the image signals (S'1, S'2, S'n) restored via said measurement paths (V1, V2, Vn) are independent of said movable surface (2). Deformable movable surface systems, of the deformable mirror type.
申请公布号 FR2985320(A1) 申请公布日期 2013.07.05
申请号 FR20110062542 申请日期 2011.12.29
申请人 ALPAO 发明人 BARRAULT MICHEL
分类号 G02B5/08 主分类号 G02B5/08
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