| 摘要 |
PURPOSE: A test handler is provided to automatically correct the location of a test tray by a pushing device in case an error is generated by the test trey within a test chamber breaks from an original location. CONSTITUTION: A test handler comprises a test tray, a loading device, a soak chamber, a test chamber, a pushing device, a desoak chamber, and an unloading device. A semiconductor chamber is settled on the test tray. The loading device loads the semiconductor device on the test tray. The soak chamber preheats and pre-cools the transferred semiconductor device. The test chamber electrically contacts the semiconductor device which is settled on the test tray to a tester. The pushing device (550) electrically contacts the semiconductor device which is settled on the test tray to the tester side. The desoat chamber returns the semiconductor device to a room temperature. The unloading device unloads the semiconductor device from the test tray which is transferred to the unloading location from a disk chamber. |
