发明名称 |
WAFER EXPOSURE METHOD, MANUFACTURING METHOD OF PIEZOELECTRIC VIBRATION PIECE, MASK FOR WAFER EXPOSURE, AND MANUFACTURING APPARATUS OF PIEZOELECTRIC VIBRATION PIECE |
摘要 |
PROBLEM TO BE SOLVED: To easily and unfailingly peel a resist film from a photo mask while preventing the resist film from being peeling from a wafer and being damaged.SOLUTION: In addition to a through hole M1a provided at a position facing an outer peripheral part of a resist film 25, a through hole M2a is provided at a position facing a center part of the resist film 25 and air is also jetted from the through hole M2a. Even when a film thickness of an outer peripheral edge part of the resist film 25, formed on a surface of a wafer S by a spin coat method, is larger than a film thickness of the inner peripheral side, the structure allows air to be injected from the through hole M2a to a space between the resist film 25 and a lower mask M1 to unfailingly separate the resist film 25 from the lower mask M1. |
申请公布号 |
JP2013131568(A) |
申请公布日期 |
2013.07.04 |
申请号 |
JP20110278852 |
申请日期 |
2011.12.20 |
申请人 |
SEIKO INSTRUMENTS INC |
发明人 |
KAWAGUCHI MASAYUKI |
分类号 |
H01L21/027;H01L41/09;H01L41/18;H01L41/22;H03H3/02 |
主分类号 |
H01L21/027 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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