发明名称 WAFER EXPOSURE METHOD, MANUFACTURING METHOD OF PIEZOELECTRIC VIBRATION PIECE, MASK FOR WAFER EXPOSURE, AND MANUFACTURING APPARATUS OF PIEZOELECTRIC VIBRATION PIECE
摘要 PROBLEM TO BE SOLVED: To easily and unfailingly peel a resist film from a photo mask while preventing the resist film from being peeling from a wafer and being damaged.SOLUTION: In addition to a through hole M1a provided at a position facing an outer peripheral part of a resist film 25, a through hole M2a is provided at a position facing a center part of the resist film 25 and air is also jetted from the through hole M2a. Even when a film thickness of an outer peripheral edge part of the resist film 25, formed on a surface of a wafer S by a spin coat method, is larger than a film thickness of the inner peripheral side, the structure allows air to be injected from the through hole M2a to a space between the resist film 25 and a lower mask M1 to unfailingly separate the resist film 25 from the lower mask M1.
申请公布号 JP2013131568(A) 申请公布日期 2013.07.04
申请号 JP20110278852 申请日期 2011.12.20
申请人 SEIKO INSTRUMENTS INC 发明人 KAWAGUCHI MASAYUKI
分类号 H01L21/027;H01L41/09;H01L41/18;H01L41/22;H03H3/02 主分类号 H01L21/027
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