发明名称 Metal Layout of an Integrated Power Transistor and the Method Thereof
摘要 The present disclosure discloses a metal layout of an integrated power transistor. The metal layout comprises a 1st metal layer, a 2nd metal layer, and a 3rd metal layer. The metal layout couples the 1st metal layer to the 2nd metal layer through vias, and couples the 2nd metal layer to the 3rd metal layer through super vias. By such interconnection, the metallization resistance is highly reduced by using thick 2nd and 3rd metal layers.
申请公布号 US2013168869(A1) 申请公布日期 2013.07.04
申请号 US201113339005 申请日期 2011.12.28
申请人 XU PENG 发明人 XU PENG
分类号 H01L23/522;H01L21/768 主分类号 H01L23/522
代理机构 代理人
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