发明名称 THROUGH-SILICON VIA STRUCTURE FORMATION PROCESS
摘要 In a process, an opening is formed to extend from a front surface of a semiconductor substrate through a part of the semiconductor substrate. A metal seed layer is formed on a sidewall of the opening. A block layer is formed on only a portion of the metal seed layer. A metal layer is formed on the block layer and the metal seed layer to fill the opening.
申请公布号 US2013171772(A1) 申请公布日期 2013.07.04
申请号 US201313775983 申请日期 2013.02.25
申请人 LIN YUNG-CHI;WU WENG-JIN;SHUE SHAU-LIN;TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD. 发明人 LIN YUNG-CHI;WU WENG-JIN;SHUE SHAU-LIN
分类号 H01L21/768 主分类号 H01L21/768
代理机构 代理人
主权项
地址