| 摘要 |
PROBLEM TO BE SOLVED: To improve the quality of a connection part between a probe and wiring in a probe assembly, to shorten the time required for connecting the probe and the wiring, and to eliminate erroneous connection between the probe and the wiring.SOLUTION: A probe assembly comprises an electrically insulated substrate, a plurality of probes supported on one side of the substrate, a plurality of through holes which are provided on the substrate correspondingly to the plurality of probes and filled with conductive materials and of which the conductive materials are adhered to the probes partially, and a plurality of conductive coatings formed on another side of the substrate and adhered to the conductive materials of the plurality of through holes, respectively. |
