| 发明名称 |
METHOD AND APPARATUS FOR MEASURING BIOMETRICS OF OBJECT |
| 摘要 |
A method for measuring biometrics of an object includes receiving an image of an object, modeling the object to identify a portion of the object, and measuring biometrics of the object based on a modeling result the object.
|
| 申请公布号 |
US2013173175(A1) |
申请公布日期 |
2013.07.04 |
| 申请号 |
US201313734217 |
申请日期 |
2013.01.04 |
| 申请人 |
SAMSUNG ELECTRONICS CO., LTD.;SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
JUNG HAE-KYUNG;YOON HEE-CHUL;LEE HYUN-TAEK;KIM YONG-JE;KIM JAE-HYUN;EOM MYUNG-JIN |
| 分类号 |
G06F19/26 |
主分类号 |
G06F19/26 |
| 代理机构 |
|
代理人 |
|
| 主权项 |
|
| 地址 |
|
