<p>The formation of test probe structures is described. One test probe structure includes a tip portion and a handle portion spaced a distance away from the tip portion. The test probe structure also includes a body bend portion positioned between the tip portion and the handle portion, and an intermediate portion positioned between the body bend portion and the handle portion. The body bend portion may include a curved shape extending from the intermediate portion to the tip portion. The tip portion may be formed to be offset from a longitudinal axis defined by the intermediate portion. The test probe structure defines a length and includes a cross-sectional area that is different at a plurality of positions along the length. Other embodiments are described and claimed.</p>
申请公布号
WO2013101238(A1)
申请公布日期
2013.07.04
申请号
WO2011US68271
申请日期
2011.12.31
申请人
INTEL CORPORATION;SWART, ROY E.;CRIPPEN, WARREN S.;KWONG, CHARLOTTE C.;SHIA, DAVID
发明人
SWART, ROY E.;CRIPPEN, WARREN S.;KWONG, CHARLOTTE C.;SHIA, DAVID