| 发明名称 |
SAMPLE HOLDER FOR ELECTRON MICROSCOPY FOR LOW-CURRENT, LOW-NOISE ANALYSIS |
| 摘要 |
<p>A novel specimen holder for insertion in electron microscopes, wherein the novel specimen holder is designed to minimize electrical noise so that signal integrity can be maintained during in situ electron microscopy.</p> |
| 申请公布号 |
WO2013102064(A1) |
申请公布日期 |
2013.07.04 |
| 申请号 |
WO2012US72050 |
申请日期 |
2012.12.28 |
| 申请人 |
PROTOCHIPS, INC. |
发明人 |
DAMIANO, JOHN;NACKASHI, DAVID, P.;GARDINER, DANIEL, S. |
| 分类号 |
H01J37/20;H01B11/06 |
主分类号 |
H01J37/20 |
| 代理机构 |
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代理人 |
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| 主权项 |
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| 地址 |
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