发明名称 Surface Processing Progress Monitoring System
摘要 Provided is a technique for calculating a hole depth or substrate thickness with high accuracy during surface processing work, such as etching or grinding. A difference spectrum calculator calculates the difference between a spectrum acquired at one time and another spectrum acquired at a time earlier than the aforementioned time by a predetermined. The base spectra which are contained in the observed spectra but do not contribute to interference can be regarded as common to the observed spectra. Therefore, the difference spectrum is a virtually normalized interference spectrum. A Fourier transform operator performs a frequency analysis on the difference spectrum, using a Fourier transform or similar technique. In the thereby obtained signal, a clear peak originating from the interference appears at a position corresponding to the optical path length. From this peak position, an optical distance calculator determines the optical path length, calculates the hole depth, and displays the calculated result.
申请公布号 US2013169958(A1) 申请公布日期 2013.07.04
申请号 US201213707407 申请日期 2012.12.06
申请人 SHIMADZU CORPORATION;SHIMADZU CORPORATION 发明人 GOTO HIROOMI;NAGUMO YUZO;KATO RUI
分类号 G01B11/14 主分类号 G01B11/14
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