发明名称 AUTOMATIC ANALYSIS DEVICE AND DETECTION METHOD FOR MEASUREMENT VALUE ABNORMALITIES
摘要 According to the present invention, an automatic analysis device that can detect measurement value abnormalities originating in reaction process abnormalities because of bubbles and foreign matter is achieved without increasing complexity of the processing or functions. A measurement value abnormality check is started, and whether concentration calculation results using light intensity data from a plurality of relevant detectors are within a determined range is checked (Steps a, b). If the concentration calculation results are within the determined range, an average value for the concentration calculation results in the relevant detectors is calculated, and if the concentration calculation results are outside of the determined range, a flag is assigned and the average value for the concentration calculation results in the relevant detectors is calculated (Steps c, d). A default value for range of fluctuation at the average value for the concentration calculation results is called up, and the range of fluctuation for the concentration calculation results in the plurality of relevant detectors is calculated, with a determination made as to whether the calculation is within a default range (Steps e, f, g). If the range of fluctuation is within the default range, the concentration calculation results are output to a display, and if outside of the default range, a request for reinspection is displayed and a measurement value abnormality alarm is added (Steps h, i, j).
申请公布号 WO2013099486(A1) 申请公布日期 2013.07.04
申请号 WO2012JP80377 申请日期 2012.11.22
申请人 HITACHI HIGH-TECHNOLOGIES CORPORATION 发明人 MAKINO AKIHISA;IIJIMA MASAHIKO;WATANABE AKIKO
分类号 G01N35/00 主分类号 G01N35/00
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