INCREASING CURRENT CARRYING CAPABILITY THROUGH DIRECT LIQUID COOLING OF TEST CONTACTS
摘要
<p>Testing methods and systems are described. One method for testing an electronic device includes providing a probe in electrical contact with a device. The method also includes positioning an interface of the probe and the device in a liquid medium. The method also includes transmitting a current from the probe through the interface while the interface is in the liquid medium. Other embodiments are described and claimed.</p>
申请公布号
WO2013101239(A1)
申请公布日期
2013.07.04
申请号
WO2011US68272
申请日期
2011.12.31
申请人
INTEL CORPORATION;CRIPPEN, WARREN S.;GROSSMAN, BRETT;SWART, ROY E.;TADAYON, POOYA
发明人
CRIPPEN, WARREN S.;GROSSMAN, BRETT;SWART, ROY E.;TADAYON, POOYA