Methods for producing silicon on insulator structures with a reduced metal content in the device layer thereof are disclosed. Silicon on insulator structures with a reduced metal content are also disclosed.
申请公布号
US2013168836(A1)
申请公布日期
2013.07.04
申请号
US201313762967
申请日期
2013.02.08
申请人
MEMC ELECTRONIC MATERIALS, INC.;MEMC ELECTRONIC MATERIALS, INC.