发明名称 |
METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE |
摘要 |
PROBLEM TO BE SOLVED: To provide a semiconductor device including an oxide semiconductor which is capable of having stable electric characteristics and achieving high reliability.SOLUTION: By applying dehydration or dehydrogenation treatment to a base insulating layer provided in contact with an oxide semiconductor layer, the water and hydrogen contents of the base insulating layer are decreased. By subsequently applying oxygen doping treatment, oxygen which can be eliminated together with water and hydrogen is supplied to the base insulating layer. By formation of the oxide semiconductor layer in contact with the base insulating layer whose water and hydrogen contents are decreased and whose oxygen content is increased, oxygen can be supplied to the oxide semiconductor layer while entry of water and hydrogen into the oxide semiconductor layer is suppressed. |
申请公布号 |
JP2013131741(A) |
申请公布日期 |
2013.07.04 |
申请号 |
JP20120254984 |
申请日期 |
2012.11.21 |
申请人 |
SEMICONDUCTOR ENERGY LAB CO LTD |
发明人 |
YAMADE NAOTO;HIZUKA JUNICHI;SUZUKI MIKI;SATO YUICHI |
分类号 |
H01L21/336;H01L21/8242;H01L21/8247;H01L27/108;H01L27/115;H01L29/786;H01L29/788;H01L29/792 |
主分类号 |
H01L21/336 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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