| 摘要 |
<p>The invention relates to a method for analysing a sample of material by diffractometry and a diffractometer, wherein: the diffractometer comprises a collimated source (1), a detection collimator (4), and a spectrometric detector (3), the detection axis D of the detector and of the collimator thereof forming with the central axis X of the incident beam a diffraction angle Theta; the sample (100) is irradiated with the incident beam. The method and the diffractometer are characterised in that the detector (3) is a virtual pixellated detector. An energy spectrum Si(E) is established for each pixel of the detector, by spectrometric measurement means (32). Preferably, the measured spectra are readjusted by a change in variable that takes into account the energy of the scattered radiation and the angle of observation 6i. Then the readjusted (or measured) spectra are combined. In a preferred version for using an open (high slit) detection collimator (4), before combining a check is made on the implementation of at least one multi-material criterion representative of the presence of a plurality of layers of materials; groups of pixels are formed according to the results of this check, each group corresponding to a same and single layer of material; then for each group formed, the readjusted spectra or measured spectra obtained for the pixels of said group are combined.</p> |
