发明名称 MAGNETIC RESISTANCE ELEMENT, SEMICONDUCTOR MEMORY, AND SYSTEM
摘要 PROBLEM TO BE SOLVED: To provide a magnetic resistance element whose characteristics are not deteriorated even by heat treatment at a high temperature.SOLUTION: A magnetic resistance element has: a free layer arranged on a semiconductor substrate; a tunnel insulating film arranged on the free layer; a fixed layer arranged on the tunnel insulating film, and including first and second magnetic layers opposed to each other while interposing an Ru film therebetween; and an antiferromagnetic layer arranged on the fixed layer, and formed by PtMn. Thickness of the Ru film is 1.5 nm or more and 1.7 nm or less.
申请公布号 JP2013131521(A) 申请公布日期 2013.07.04
申请号 JP20110278056 申请日期 2011.12.20
申请人 FUJITSU LTD 发明人 YOSHIDA CHIKAKO;RI EIMIN
分类号 H01L43/08;G11C11/15;H01L21/8246;H01L27/105;H01L29/82 主分类号 H01L43/08
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