发明名称 |
MAGNETIC RESISTANCE ELEMENT, SEMICONDUCTOR MEMORY, AND SYSTEM |
摘要 |
PROBLEM TO BE SOLVED: To provide a magnetic resistance element whose characteristics are not deteriorated even by heat treatment at a high temperature.SOLUTION: A magnetic resistance element has: a free layer arranged on a semiconductor substrate; a tunnel insulating film arranged on the free layer; a fixed layer arranged on the tunnel insulating film, and including first and second magnetic layers opposed to each other while interposing an Ru film therebetween; and an antiferromagnetic layer arranged on the fixed layer, and formed by PtMn. Thickness of the Ru film is 1.5 nm or more and 1.7 nm or less. |
申请公布号 |
JP2013131521(A) |
申请公布日期 |
2013.07.04 |
申请号 |
JP20110278056 |
申请日期 |
2011.12.20 |
申请人 |
FUJITSU LTD |
发明人 |
YOSHIDA CHIKAKO;RI EIMIN |
分类号 |
H01L43/08;G11C11/15;H01L21/8246;H01L27/105;H01L29/82 |
主分类号 |
H01L43/08 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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