发明名称 ION BEAM MASK, SUBSTRATE PROCESSING APPARATUS, AND SUBSTRATE PROCESSING SYSTEM
摘要 PURPOSE: A mask assembly, a substrate processing device, and a substrate processing system thereof are provided to prevent deformation due to the pressure and heat by employing mechanically strong structures and materials to a frame unit and making a mask unit with ion beam-resistant materials; preventing errors in processing substrates; and reducing the production costs. CONSTITUTION: A mask assembly (300) is installed between an ion beam irradiation unit and a transport path, and part of the ion beam is placed on the surface of a substrate. A frame unit (310) has more than one opening unit (311) to and from which the mask assembly attaches and detaches. The mask assembly includes a mask unit (320) with more than one pattern hole (321) which is for irradiating part of an ion beam on the surface of a substrate.
申请公布号 KR20130073185(A) 申请公布日期 2013.07.03
申请号 KR20110140898 申请日期 2011.12.23
申请人 WONIK IPS CO., LTD. 发明人 WI, KYU YONG
分类号 H01J29/06 主分类号 H01J29/06
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