| 摘要 |
PURPOSE: A semiconductor device is provided to reduce an area occupied by a circuit as much as a corresponding repetition number by repeatedly generating a rupturing enable signal using a feedback structure. CONSTITUTION: A plurality of repair fuse circuits (120,130) programs each repair object address. A rupturing enable signal generating unit (110) repeatedly generates first to fourth rupturing enable signals (EN1-EN4) in response to a rupturing source signal, generates one or more enable signals in response to a source signal, and commonly provides the enable signal to each repair fuse circuit. [Reference numerals] (110) Rupturing enable signal generating unit; (120) First repair fuse circuit; (130) Second repair fuse circuit |
