发明名称 |
SEMICONDUCTOR ELEMENT, METHOD FOR MANUFACTURING THE SEMICONDUCTOR ELEMENT, AND SEMICONDUCTOR DEVICE INCLUDING THE SEMICONDUCTOR ELEMENT |
摘要 |
<p>PURPOSE: A semiconductor element, a method for manufacturing the semiconductor element, and a semiconductor device using the semiconductor element are provided to reduce the contact resistance between a low resistance region and an electrode by extending the contact area between the oxide semiconductor layer and the electrode. CONSTITUTION: An oxide semiconductor layer includes a channel formation region. A first insulating layer is formed on the oxide semiconductor layer. A gate electrode (108) faces the upper surface of the channel formation region, a first lateral surface, and a second lateral surface. A second insulating layer is formed on the gate electrode. A first electrode and a second electrode are formed on the second insulating layer.</p> |
申请公布号 |
KR20130073829(A) |
申请公布日期 |
2013.07.03 |
申请号 |
KR20120149009 |
申请日期 |
2012.12.19 |
申请人 |
SEMICONDUCTOR ENERGY LABORATORY CO., LTD. |
发明人 |
ISOBE ATSUO;GODO HIROMICHI |
分类号 |
H01L29/786;H01L21/336 |
主分类号 |
H01L29/786 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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