发明名称 CONDUCTOR LENGTH MEASUREMENT DEVICE AND CONDUCTOR LENGTH MEASUREMENT METHOD
摘要 Probes (13a, 13b) of a conductor length measurement device (10) are connected to piping (23), and an output voltage (Vo) is applied to the piping (23) through the probes (13a, 13b). A frequency spectrum curve is subsequently calculated by subjecting a voltage signal (SV1) to FFT. Resonant frequencies of the piping (23) are then determined from this frequency spectrum curve, and the total length of the piping (23) is calculated on the basis of the resonant frequencies. The total length of the piping (23) can therefore be easily measured without the need to install, for example, any measurement instruments at branch terminals.
申请公布号 EP2610584(A1) 申请公布日期 2013.07.03
申请号 EP20110819614 申请日期 2011.01.25
申请人 MITSUBISHI ELECTRIC CORPORATION 发明人 HIGUMA TOSHIYASU;HIBARA NAOYUKI;GYOTA TOMOAKI
分类号 G01B7/02;F24F1/26 主分类号 G01B7/02
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