发明名称 Method and apparatus for self-test of successive approximation register (SAR) A/D converter
摘要 A single-ended SAR ADC includes an additional capacitor, a self-test engine, and independent control of sample and hold conditions, which allows for quick and accurate testing of the ADC.
申请公布号 US8477052(B2) 申请公布日期 2013.07.02
申请号 US201113079818 申请日期 2011.04.05
申请人 DEY SANJOY K.;BERENS MICHAEL T.;FEDDELER JAMES R.;VARMA VIKRAM;FREESCALE SEMICONDUCTOR, INC. 发明人 DEY SANJOY K.;BERENS MICHAEL T.;FEDDELER JAMES R.;VARMA VIKRAM
分类号 H03M1/10 主分类号 H03M1/10
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