SEMICONDUCTOR MEMORY DEVICE AND TEST METHOD OF THE SAME

摘要

PURPOSE: A semiconductor memory device and a test method thereof are provided to directly output setting data to the outside while maintaining a small chip size without adding an internal register. CONSTITUTION: A setting data storage block (120) repeatedly stores setting data over two times. A first delivery unit (140) delivers the repeatedly stored setting data read through an access unit. A data determination unit (160) determines correct data using the repeatedly stored setting data delivered by the first delivery unit. A second delivery unit (150) delivers normal data read through a data access unit. A data output unit (170) outputs the repeatedly stored setting data delivered by the first delivery unit or the normal data delivered by the second delivery unit to the outside in response to a control signal. [Reference numerals] (110_0) Normal data storage block 0; (110_1) Normal data storage block 1; (110_N) Normal data storage block N; (120) Setting data storage block; (130) Page buffer array; (140) First delivery unit; (150) Second delivery unit; (160) Data determination unit; (170) Data output unit; (AA) Output to a circuit requiring setting data