SEMICONDUCTOR MEMORY DEVICE

摘要

PURPOSE: A semiconductor device is provided to minimize power consumption in a test operation mode by activating only a test reference voltage generation unit in the test operation mode. CONSTITUTION: A normal reference voltage generation unit (110) has a plurality of unit distribution resistors having respective scheduled resistance value and generates normal reference voltage corresponding to the plurality of unit distribution resistance in a normal operation mode. A test reference voltage generation unit (120) has a plurality of test distribution resistors having resistance value greater than the plurality of unit distribution resistors and generates test reference voltage corresponding to the plurality of test distribution resistors in a test operation mode. A mode operation unit performs operation corresponding to a corresponding mode by receiving corresponding reference voltage in the normal operation mode and test operation mode. [Reference numerals] (110) Normal reference voltage generation unit; (120) Test reference voltage generation unit; (130) Input buffering unit