发明名称 SECONDARY ALLOYED 1N COPPER WIRE FOR BONDING IN MICROELECTRONICS DEVICE
摘要 A secondary alloyed 1N copper wire for bonding in microelectronics contains one or more corrosion resistance alloying materials selected from Ag, Ni, Pd, Au, Pt, and Cr. A total concentration of the corrosion resistance alloying materials is between about 0.09 wt % and about 9.9 wt %.
申请公布号 SG190479(A1) 申请公布日期 2013.06.28
申请号 SG20110089083 申请日期 2011.12.01
申请人 HERAEUS MATERIALS TECHNOLOGY GMBH & CO. KG. 发明人 SARANGAPANI MURALI;YEUNG PING HA;EUGEN MILKE
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