| 摘要 |
The present invention provides a contact probe pin in which a carbon filmhaving both of conductivity and durability is formed on a base material with a tip5 divided, wherein Sn adherence can be reduced as much as possible to be able to maintain stable electrical contact over a long period of time, even under such circumstances that the temperature of a usage environment becomes high. The present invention relates to a contact probe pin, including a tip divided into 2 or moreprojections and repeatedly coming into contact with a test surface at the projection,10 wherein a carbon film containing a metal element is formed at least on a surface of the projection, and a radius of curvature at an apex part of the projection is 30 gm or more. |
