发明名称 LUMINANCE TEST SYSTEM AND METHOD FOR LIGHT EMITTING DIODES
摘要 A luminance test system includes a plurality of LEDs, a microcontroller, a plurality of light sensors, a plurality of shielding members, a plurality of AD converters, a MCU and a display module. Each of the plurality of light sensors detects a luminance of one of the plurality of LEDs to generate an analog luminance signal. Each of the shielding members receives one of the plurality of LEDs and one of the plurality of light sensors. Each of the plurality AD converters converts the analog luminance signal into a digital luminance signal. The plurality of AD converters in turn transmit the digital luminance signal to the MCU. The display module displays a luminance value of each of the plurality of LEDs according to the digital luminance signal.
申请公布号 US2013162692(A1) 申请公布日期 2013.06.27
申请号 US201213611093 申请日期 2012.09.12
申请人 WANG KANG-BIN;HON HAI PRECISION INDUSTRY CO., LTD.;HONG FU JIN PRECISION INDUSTRY (SHENZHEN) CO., LTD. 发明人 WANG KANG-BIN
分类号 G09G3/32;G09G5/10 主分类号 G09G3/32
代理机构 代理人
主权项
地址