发明名称 |
PROBE CARD AND METHOD OF MANUFACTURING THE SAME |
摘要 |
There are provided a probe card and a method of manufacturing the same, in which an electrode pad having a probe pin bonded thereto may be prevented from being delaminated from a substrate. The probe card according to embodiments of the present invention may include a ceramic substrate including at least one pad groove formed in one surface thereof and an electrode pad embedded in the pad groove; and a probe pin bonded to the electrode pad.
|
申请公布号 |
US2013162280(A1) |
申请公布日期 |
2013.06.27 |
申请号 |
US201213532435 |
申请日期 |
2012.06.25 |
申请人 |
CHUNG DOO YUN;LEE DAE HYEONG;HONG KI PYO;MA WON CHUL;CHOI YONG SEOK;SAMSUNG ELECTRO-MECHANICS CO., LTD. |
发明人 |
CHUNG DOO YUN;LEE DAE HYEONG;HONG KI PYO;MA WON CHUL;CHOI YONG SEOK |
分类号 |
G01R31/26;B23K31/02 |
主分类号 |
G01R31/26 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|