发明名称 PROBE CARD AND METHOD OF MANUFACTURING THE SAME
摘要 There are provided a probe card and a method of manufacturing the same, in which an electrode pad having a probe pin bonded thereto may be prevented from being delaminated from a substrate. The probe card according to embodiments of the present invention may include a ceramic substrate including at least one pad groove formed in one surface thereof and an electrode pad embedded in the pad groove; and a probe pin bonded to the electrode pad.
申请公布号 US2013162280(A1) 申请公布日期 2013.06.27
申请号 US201213532435 申请日期 2012.06.25
申请人 CHUNG DOO YUN;LEE DAE HYEONG;HONG KI PYO;MA WON CHUL;CHOI YONG SEOK;SAMSUNG ELECTRO-MECHANICS CO., LTD. 发明人 CHUNG DOO YUN;LEE DAE HYEONG;HONG KI PYO;MA WON CHUL;CHOI YONG SEOK
分类号 G01R31/26;B23K31/02 主分类号 G01R31/26
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