发明名称 LOW RESISTANCE THROUGH-WAFER VIA
摘要 The present invention provides a wafer (3) comprising a through-wafer via (7) through the wafer (3) formed by a through-wafer via hole (9) and at least a first conductive coating (25). A substantially vertical sidewall (11) of the through-wafer via hole (9) except for a constriction (23) provides a reliable through-wafer via (7) occupying a small area on the wafer. The wafer (3) is preferably made of a semiconductor material, such as silicon, or a glass ceramic. A method for manufacturing such a wafer (3) is described.
申请公布号 US2013164935(A1) 申请公布日期 2013.06.27
申请号 US201213692303 申请日期 2012.12.03
申请人 AAC MICROTEC AB;AAC MICROTEC AB 发明人 NILSSON PETER
分类号 H01L21/768 主分类号 H01L21/768
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