发明名称 GATE ALIGNED CONTACT AND METHOD TO FABRICATE SAME
摘要 Gate aligned contacts and methods of forming gate aligned contacts are described. For example, a method of fabricating a semiconductor structure includes forming a plurality of gate structures above an active region formed above a substrate. The gate structures each include a gate dielectric layer, a gate electrode, and sidewall spacers. A plurality of contact plugs is formed, each contact plug formed directly between the sidewall spacers of two adjacent gate structures of the plurality of gate structures. A plurality of contacts is formed, each contact formed directly between the sidewall spacers of two adjacent gate structures of the plurality of gate structures. The plurality of contacts and the plurality of gate structures are formed subsequent to forming the plurality of contact plugs.
申请公布号 WO2013095548(A1) 申请公布日期 2013.06.27
申请号 WO2011US66989 申请日期 2011.12.22
申请人 INTEL CORPORATION;GOLONZKA, OLEG;SIVAKUMAR, SWAMINATHAN;WALLACE, CHARLES, H.;GHANI, TAHIR 发明人 GOLONZKA, OLEG;SIVAKUMAR, SWAMINATHAN;WALLACE, CHARLES, H.;GHANI, TAHIR
分类号 H01L21/28;H01L21/3205;H01L21/336;H01L29/78 主分类号 H01L21/28
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