发明名称 TEST APPARATUS FOR TESTING SIGNAL TRANSMISSION OF MOTHERBOARD
摘要 A test apparatus for testing peripheral component interconnect express (PCIe) signals transmission of a motherboard includes a printed circuit board including an edge connector, a number of first switches having a same number with the type of the PCIe signals to be test, an encoder, and a microprocessor. The first switches are used to select a type selection signal. The encoder converts signals outputted from the first switches to binary data. The microprocessor outputs clock signals to a PCIe controller according to the binary data to make the PCIe controller transmit the PCIe signal to the PCIe slot.
申请公布号 US2013166954(A1) 申请公布日期 2013.06.27
申请号 US201213568041 申请日期 2012.08.06
申请人 XU LI;HON HAI PRECISION INDUSTRY CO., LTD.;HONG FU JIN PRECISION INDUSTRY (SHENZHEN) CO., LTD. 发明人 XU LI
分类号 G06F11/273 主分类号 G06F11/273
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