发明名称 SEMICONDUCTOR MEMORY DEVICE AND TEST METHOD OF THE SAME
摘要 A semiconductor memory device includes a normal data storage block configured to store a normal data, a setup data storage block for storing a setup data including at least two duplicate data, an access unit configured to access the normal data of the normal data storage block or the setup data of the setup data storage block, a first transfer unit configured to transfer the setup data accessed by the access unit, a data decision unit configured to determine a correct data based on the setup data transferred by the first transfer unit, a second transfer unit configured to transfer the normal data accessed by the access unit, and a data output unit configured to output the setup data transferred by the first transfer unit or the normal data transferred by the second transfer unit to the outside of the semiconductor memory device in response to a control signal.
申请公布号 US2013166959(A1) 申请公布日期 2013.06.27
申请号 US201213494492 申请日期 2012.06.12
申请人 JOO BYOUNG-IN;YANG CHUL-WOO 发明人 JOO BYOUNG-IN;YANG CHUL-WOO
分类号 G06F12/00;G06F11/28 主分类号 G06F12/00
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