发明名称 |
FABRICATING METHOD OF WAFER |
摘要 |
PURPOSE: A method of manufacturing wafer is provided to effectively control impurity by preventing diffusion of impurity existing in a wafer to a wafer before thermal processing. CONSTITUTION: A wafer is cleaned(S110). The wafer is loaded to a thermal processing apparatus(S120). The wafer is first thermal processed at first temperature(S130). The wafer is etched(S140). The wafer is second thermal processed at second temperature(S150). [Reference numerals] (AA) Start; (BB) Finish; (S110) Wafer is cleaned; (S120) Thermal processing apparatus; (S130) Wafer is first processed at first temperature; (S140) Wafer is etched; (S150) Wafer is second thermal processed at second temperature
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申请公布号 |
KR20130069935(A) |
申请公布日期 |
2013.06.27 |
申请号 |
KR20110136993 |
申请日期 |
2011.12.19 |
申请人 |
LG SILTRON INCORPORATED |
发明人 |
LEE, DONG KYU;KIM, JAE SUN |
分类号 |
H01L21/322 |
主分类号 |
H01L21/322 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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