| 摘要 |
<P>PROBLEM TO BE SOLVED: To prevent deformation well while improving contact property of a movable contact, with a simple configuration, and to allow easy inspection of a plurality of sets of electronic circuits. <P>SOLUTION: A tip end of an expanded/extended part 12a7 which extends from a circuit contact point 12a4 of a movable contact 12a provided to a connector 10 with a switch, is caused to abut with an insulating housing 11. By the support reaction at the tip end of the expanded/extended part 12a7, the circuit contact point 12a4 of the movable contact 12a is pressurized to a fixed contact 13a side. A conductive part 20b of a probe 20a is arranged to be selectively contacted to any of the movable contacts 12a and 12b arranged by a plurality of numbers at an insulating housing 11, so that an electronic circuit connected to the movable contact 12a to which the conductive part 20b of the probe 20a contacts is become conductive to the probe. <P>COPYRIGHT: (C)2013,JPO&INPIT |
