发明名称 Silicon Oxynitride Film Formation Method and Substrate Equipped with Silicon Oxynitride Film Formed Thereby
摘要 The present invention provides a silicon oxynitride film formation method capable of reducing energy cost, and also provides a substrate equipped with a silicon oxynitride film formed thereby. This method comprises the steps of: casting a film-formable coating composition containing a polysilazane compound on a substrate surface to form a coat; drying the coat to remove excess of the solvent therein; and then irradiating the dried coat with UV light at a temperature lower than 150° C.
申请公布号 US2013164690(A1) 申请公布日期 2013.06.27
申请号 US201113704532 申请日期 2011.08.10
申请人 SHINDE NINAD;NAGAHARA TATSURO;TAKANO YUSUKE;AZ ELECTRONIC MATERIALS USA CORP. 发明人 SHINDE NINAD;NAGAHARA TATSURO;TAKANO YUSUKE
分类号 B05D3/06 主分类号 B05D3/06
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