发明名称 |
SEMICONDUCTOR DEVICES AND METHODS OF MANUFACTURING THE SAME |
摘要 |
A semiconductor device may include a gate structure on a substrate, the gate structure including a first metal; an insulating interlayer covering the gate structure on the substrate; a resistance pattern in the insulating interlayer, the resistance pattern having a top surface lower than a top surface of the insulating interlayer and including a second metal different from the first metal at least at an upper portion thereof; and/or a first contact plug through a first portion of the insulating interlayer, the first contact plug making direct contact with the upper portion of the resistance pattern. |
申请公布号 |
US2013161722(A1) |
申请公布日期 |
2013.06.27 |
申请号 |
US201213712109 |
申请日期 |
2012.12.12 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD.;SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
SON SUNG-HO;KIM YOON-HAE;KANG HONG-SEONG;LEE YOON-SEOK;XIONG JUNJIE |
分类号 |
H01L29/78;H01L29/788 |
主分类号 |
H01L29/78 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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