发明名称 SEMICONDUCTOR DEVICES AND METHODS OF MANUFACTURING THE SAME
摘要 A semiconductor device may include a gate structure on a substrate, the gate structure including a first metal; an insulating interlayer covering the gate structure on the substrate; a resistance pattern in the insulating interlayer, the resistance pattern having a top surface lower than a top surface of the insulating interlayer and including a second metal different from the first metal at least at an upper portion thereof; and/or a first contact plug through a first portion of the insulating interlayer, the first contact plug making direct contact with the upper portion of the resistance pattern.
申请公布号 US2013161722(A1) 申请公布日期 2013.06.27
申请号 US201213712109 申请日期 2012.12.12
申请人 SAMSUNG ELECTRONICS CO., LTD.;SAMSUNG ELECTRONICS CO., LTD. 发明人 SON SUNG-HO;KIM YOON-HAE;KANG HONG-SEONG;LEE YOON-SEOK;XIONG JUNJIE
分类号 H01L29/78;H01L29/788 主分类号 H01L29/78
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