| 摘要 |
<P>PROBLEM TO BE SOLVED: To provide a scan flip-flop that performs scan shift operation normally with either a positive edge or a negative edge of a clock signal. <P>SOLUTION: The scan flip-flop includes a master latch which holds or does not hold and outputs a received data signal or scan test signal in synchronism with the clock signal according to a scan enable signal, and a slave latch which holds or does not hold and outputs a signal received from the master latch in synchronism with the scan enable signal and clock signal, the scan enable signal varying from a first level to a second level before a pulse wave included in the clock signal rises and varying from the second level to the first level after the pulse wave rises, and varying from the first level to the second level before the pulse wave falls and varying from the second level to the first level after the pulse wave falls. <P>COPYRIGHT: (C)2013,JPO&INPIT |
