CRITICAL CAPACITOR BUILT IN TEST

摘要

An electronic circuit and method for carrying out built in test of a capacitor connected to, and arranged to suppress noise at, an input of an electrical circuit is disclosed. The electronic circuit causes current pulses at the input, and monitors the voltage at the input by comparing the voltage at the input with high and/or low reference voltages, outputting a fault signal if the voltage at the input is greater than a high reference voltage or lower than a low reference voltage.