发明名称 RINSE SOLUTION FOR LITHOGRAPHY AND PATTERN FORMATION METHOD EMPLOYING THE SAME
摘要 The present invention provides a rinse solution for lithography and a pattern formation method using the solution. They can improve prevention of both the pattern collapse and the melting at the same time. The solution contains water and a particular nitrogen-containing compound having an organic group, such as, alkyl amine or the like. The rinse solution may further contain a nonionic surfactant, if necessary.
申请公布号 US2013164694(A1) 申请公布日期 2013.06.27
申请号 US201113812737 申请日期 2011.08.09
申请人 WANG XIAOWEI;MATSUURA YURIKO;PAWLOWSKI GEORG;AZ ELECTRONIC MATERIALS USA CORP. 发明人 WANG XIAOWEI;MATSUURA YURIKO;PAWLOWSKI GEORG
分类号 G03F7/40;G03F7/20 主分类号 G03F7/40
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