发明名称 DEVICE SPECIFIC INFORMATION GENERATION DEVICE AND DEVICE SPECIFIC INFORMATION GENERATION METHOD
摘要 Obtained by the present invention is a device that outputs a glitch which satisfies the desired performance and that does not suffer from impacts arising during device manufacturing or impacts due to the deterioration of the device over time. The device is provided with a bit generation unit (310) having a glitch producing circuit (330) and a bit transformation circuit (340) for transforming the shape of a glitch into information bits. The glitch producing circuit has a plurality of combination circuits (331) mounted thereon and thereby outputs a plurality of different glitches. The bit generation unit further has a selector (332) that, in accordance with a selection signal, selects one glitch from among the plurality of different glitches and outputs the same to the bit transformation circuit. The device is further provided with a performance evaluation and control unit (350) that by outputting the selection signal obtains bit information corresponding to the plurality of different glitches respectively, and on the basis of this respective bit information, specifies a glitch which satisfies the desired performance.
申请公布号 WO2013094056(A1) 申请公布日期 2013.06.27
申请号 WO2011JP79820 申请日期 2011.12.22
申请人 MITSUBISHI ELECTRIC CORPORATION;SHIMIZU, KOICHI 发明人 SHIMIZU, KOICHI
分类号 G09C1/00;H04L9/10;H04L9/32 主分类号 G09C1/00
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