发明名称 PROCESS AND SYSTEM FOR DESIGNING A PHOTOLITHOGRAPHY MASK AND A LIGHT SOURCE
摘要 A method for designing a photolithography mask and a light source may include designing an initial photolithography mask and an initial light source using an initial target pattern corresponding to a desired target pattern in a resist layer. The method may also include designing a new target pattern and designing a new photolithography mask and/or a new light source using the new target pattern.
申请公布号 US2013164658(A1) 申请公布日期 2013.06.27
申请号 US201213727172 申请日期 2012.12.26
申请人 STMICROELECTRONICS (CROLLES 2) SAS;STMICROELECTRONICS (CROLLES 2) SAS 发明人 ALLEAUME CLOVIS
分类号 G06F17/50 主分类号 G06F17/50
代理机构 代理人
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