发明名称 |
UNIVERSAL TEST SYSTEM FOR TESTING ELECTRICAL AND OPTICAL HOSTS |
摘要 |
<p>According to an example implementation, a universal tester includes a host interface slot connected to a first pluggable host card during an electrical test mode of operation to provide a stressed electrical signal to a host under test. The host interface slot is connected to a second pluggable host card during an optical test mode of operation, the second pluggable host card including an electrical-optical conversion block to convert a stressed electrical signal to a stressed optical signal that is provided to a host under test. A stressor generator may operation in pass-through mode or a loop-back mode.</p> |
申请公布号 |
WO2013096250(A1) |
申请公布日期 |
2013.06.27 |
申请号 |
WO2012US70248 |
申请日期 |
2012.12.18 |
申请人 |
CISCO TECHNOLOGY, INC. |
发明人 |
ACHKIR, D., BRICE;MAZZINI, MARCO;RIBOLDI, STEFANO;MUZIO, CRISTIANA |
分类号 |
H04L1/24 |
主分类号 |
H04L1/24 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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